TEM Sample Preparation Short Course

6/17 9am-12pm – Lectures on techniques & materials 6/17 1-5pm, 6/24-6/26 9am-5pm – Practicum and 7/1 makeup day • FIB • polished cross-sections and plan-view • H-bar sample prep • Electropolishing • TEM Participants will have the option to practice TEM sample preparation and TEM imaging with a sample from their own project. Submitting samples ahead of time is preferred to accommodate as many samples as possible. Lunch will be included, registration is limited to 25 participants
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